Microelectronics and Reliability, Microelectronics Reliability

ISSN: 0026-2714
Publisher: PERGAMON-ELSEVIER SCIENCE LTD

---

Web of Science Journals Metrics

Year	Impact Factor	Impact Factor (5 year)
2023	1.6	1.6
2022	1.6	1.7
2021	1.418	1.634

See More (Data from Journal Citation Reports)

AHCI listed:

| SCIE listed:

| SSCI listed:

---

Scopus Journals Metrics

Year	CiteScore	SJR	SNIP
2023	3.3	0.39	0.8
2022	2.8	0.36	0.79
2021	3.5	0.45	0.85